Two- and Three-dimensional Vision Systems for Inspection, Control, and Metrology

Download or read book Two- and Three-dimensional Vision Systems for Inspection, Control, and Metrology written by Bruce G. Batchelor and published by SPIE-International Society for Optical Engineering. This book was released on 2004 with total page 228 pages. Available in PDF, EPUB and Kindle. Book excerpt: Proceedings of SPIE present the original research papers presented at SPIE conferences and other high-quality conferences in the broad-ranging fields of optics and photonics. These books provide prompt access to the latest innovations in research and technology in their respective fields. Proceedings of SPIE are among the most cited references in patent literature.