Study of Gallium Nitride CAVET for Power Electronics and RF Application
Author | : Saptarshi Mandal |
Publisher | : |
Total Pages | : |
Release | : 2017 |
ISBN-10 | : 0355764148 |
ISBN-13 | : 9780355764147 |
Rating | : 4/5 (48 Downloads) |
Download or read book Study of Gallium Nitride CAVET for Power Electronics and RF Application written by Saptarshi Mandal and published by . This book was released on 2017 with total page pages. Available in PDF, EPUB and Kindle. Book excerpt: Gallium Nitride-based (GaN-based) devices for power electronics have gained considerable momentum in recent years. Any improvement in conventional silicon-based (Si-based) devices is now incremental. The figure-of-merit for GaN is significantly higher than for Si due to GaN’s wide band-gap and high mobility, which result in high breakdown field and low on-resistance, respectively. Commercial GaN power devices are based on a lateral device topology: namely AlGaN/GaN high-electron mobility transistors (HEMTs). However, HEMTs exhibit well-known dispersion effects that lead to current collapse, increasing the dynamic ON resistance. The breakdown voltage in lateral HEMTs scale with gate-to-drain distance, which necessitates the lateral scaling up of devices to support high breakdown. Vertical topology has inherent advantages due to a buried electric field which enables dispersion-free operation and allows for vertical scaling. The present work addresses the device design, fabrication, and characterization of current-aperture vertical-electron transistors (CAVETs) for power switching application. A study of ion-implanted current-blocking layer (CBL) is used to demonstrate the potential to achieve high breakdown voltage. CAVETs with gate dielectrics show a premature breakdown of 60V due to gate dielectric failure. When the dielectric was replaced by a p-n junction, the breakdown voltage was improved to 500V by using a multiple energy-implantation scheme for the CBL. Thermal analysis of CAVETs was performed, and extracted device-thermal resistance was compared with lateral HEMTs grown on multiple substrates. GaN vertical diodes with avalanche capability were also fabricated and analyzed as potential candidates for transit-time diodes. Finally, design modifications were provided as future work to utilize the CAVET structures in RF power amplifiers.