Microwave-measurement-based IC Interconnect Characterization, Modeling, and Simulation for High Speed VLSI Circuit Design

Microwave-measurement-based IC Interconnect Characterization, Modeling, and Simulation for High Speed VLSI Circuit Design
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Total Pages : 460
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ISBN-10 : OCLC:29860915
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Book Synopsis Microwave-measurement-based IC Interconnect Characterization, Modeling, and Simulation for High Speed VLSI Circuit Design by : Yungseon Eo

Download or read book Microwave-measurement-based IC Interconnect Characterization, Modeling, and Simulation for High Speed VLSI Circuit Design written by Yungseon Eo and published by . This book was released on 1993 with total page 460 pages. Available in PDF, EPUB and Kindle. Book excerpt:


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