Low Temperature Scanning Tunneling Microscope Study of Metallic Thin Films on the Semiconductor Substrates
| Author | : Daejin Eom |
| Publisher | : |
| Total Pages | : |
| Release | : 2005 |
| ISBN-10 | : OCLC:67120225 |
| ISBN-13 | : |
| Rating | : 4/5 (25 Downloads) |
Book Synopsis Low Temperature Scanning Tunneling Microscope Study of Metallic Thin Films on the Semiconductor Substrates by : Daejin Eom
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