Characterization of Stress in GAN-on-sapphire Microelectromechanical Systems (MEMS) Structures Using Micro-Raman Spectroscopy
Author | : Francisco E. Parada |
Publisher | : |
Total Pages | : 166 |
Release | : 2006 |
ISBN-10 | : OCLC:76805823 |
ISBN-13 | : |
Rating | : 4/5 (23 Downloads) |
Book Synopsis Characterization of Stress in GAN-on-sapphire Microelectromechanical Systems (MEMS) Structures Using Micro-Raman Spectroscopy by : Francisco E. Parada
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