Atomic-Scale Friction Measurements Using Friction Force Microscopy: Part II- Application to Magnetic Media

Download or read book Atomic-Scale Friction Measurements Using Friction Force Microscopy: Part II- Application to Magnetic Media written by and published by . This book was released on 1993 with total page 9 pages. Available in PDF, EPUB and Kindle. Book excerpt: Atomic Force/Friction Force Microscopes (AFM/FFM) were used to study tribological properties of metal-particle tapes with two roughnesses, Co gamma Fe2O3 tapes (unwiped and wiped), and unlubricated and lubricated thin-film magnetic rigid disks (as-polished and standard textured). Nanoindentation studies showed that the hardness of the tapes through the magnetic coating is not uniform. These results are consistent with the fact that the tape surface is a composite and is not homogeneous. Nanoscratch experiments performed on magnetic tapes using silicon nitride tips revealed that deformation and displacement of tape surface material occurred after one pass under light loads approx. 100 nN). A comparison between friction force profiles and the corresponding surface roughness profiles of all samples tested shows a poor correlation between localized values of friction and surface roughness.