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Logic Testing and Design for Testability
Language: en
Pages: 314
Authors: Hideo Fujiwara
Categories: Logic circuits
Type: BOOK - Published: 1985 - Publisher: MIT Press

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Design for testability techniques offer one approach toward alleviating this situation by adding enough extra circuitry to a circuit or chip to reduce the compl
An Introduction to Logic Circuit Testing
Language: en
Pages: 99
Authors: Parag K. Lala
Categories: Technology & Engineering
Type: BOOK - Published: 2022-06-01 - Publisher: Springer Nature

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An Introduction to Logic Circuit Testing provides a detailed coverage of techniques for test generation and testable design of digital electronic circuits/syste
VLSI Test Principles and Architectures
Language: en
Pages: 809
Authors: Laung-Terng Wang
Categories: Technology & Engineering
Type: BOOK - Published: 2006-08-14 - Publisher: Elsevier

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This book is a comprehensive guide to new DFT methods that will show the readers how to design a testable and quality product, drive down test cost, improve pro
Advanced VLSI Design and Testability Issues
Language: en
Pages: 379
Authors: Suman Lata Tripathi
Categories: Technology & Engineering
Type: BOOK - Published: 2020-08-18 - Publisher: CRC Press

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This book facilitates the VLSI-interested individuals with not only in-depth knowledge, but also the broad aspects of it by explaining its applications in diffe
System-on-Chip Test Architectures
Language: en
Pages: 893
Authors: Laung-Terng Wang
Categories: Technology & Engineering
Type: BOOK - Published: 2010-07-28 - Publisher: Morgan Kaufmann

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Modern electronics testing has a legacy of more than 40 years. The introduction of new technologies, especially nanometer technologies with 90nm or smaller geom