Characterization of Stress in GAN-on-sapphire Microelectromechanical Systems (MEMS) Structures Using Micro-Raman Spectroscopy
| Author | : Francisco E. Parada |
| Publisher | : |
| Total Pages | : 166 |
| Release | : 2006 |
| ISBN-10 | : OCLC:76805823 |
| ISBN-13 | : |
| Rating | : 4/5 (23 Downloads) |
Book Synopsis Characterization of Stress in GAN-on-sapphire Microelectromechanical Systems (MEMS) Structures Using Micro-Raman Spectroscopy by : Francisco E. Parada
Download or read book Characterization of Stress in GAN-on-sapphire Microelectromechanical Systems (MEMS) Structures Using Micro-Raman Spectroscopy written by Francisco E. Parada and published by . This book was released on 2006 with total page 166 pages. Available in PDF, EPUB and Kindle. Book excerpt:
