X-ray diffraction is a useful and powerful analysis technique for characterizing crystalline materials commonly employed in MSE, physics, and chemistry. This in
X-ray diffraction crystallography for powder samples is a well-established and widely used method. It is applied to materials characterization to reveal the ato
X-ray line profile analysis is an effective and non-destructive method for the characterization of the microstructure in crystalline materials. Supporting resea
This book presents a physical approach to the diffraction phenomenon and its applications in materials science. An historical background to the discovery of X-r
An indispensable resource for researchers and students in materials science, chemistry, physics, and pharmaceuticals Written by one of the pioneers of 2D X-Ray