Classical Charged Particle Beam Optics used in the design and operation of all present-day charged particle beam devices, from low energy electron microscopes t

Classical Charged Particle Beam Optics used in the design and operation of all present-day charged particle beam devices, from low energy electron microscopes t

Fourier analysis is one of the most important concepts when you apply physical ideas to engineering issues. This book provides a comprehensive understanding of

Coherent Electron Microscopy: Designing Faster and Brighter Electron Sources, Volume 227 in the Advances in Imaging and Electron Physics series, merges two long

The frontiers of beam research point to increasingly high energy, greater brightness and lower emittance beams with ever-increasing particle species. These dema