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Characterization of High Tc Materials and Devices by Electron Microscopy
Language: en
Pages: 409
Authors: Nigel D. Browning
Categories: Science
Type: BOOK - Published: 2000-07-06 - Publisher: Cambridge University Press

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This is a clear account of the application of electron-based microscopies to the study of high-Tc superconductors. Written by leading experts, this compilation
High Tc Superconductivity: Thin Film Materials and Device Research
Language: en
Pages: 7
Authors: R. A. Buhrman
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Type: BOOK - Published: 1991 - Publisher:

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This project was concerned with the growth and study of high quality HTS thin films, with the principal HTS material focus being on YBa2Cu3O7, and with research
Growth and Characterization of Semiconductor Materials and Devices for Extreme Environments Applications
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Pages: 400
Authors: Abbas Sabbar
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Type: BOOK - Published: 2020 - Publisher:

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Numerous industries require electronics to operate reliably in harsh environments, such as extreme high temperatures (HTs), low temperature (LT), radiation rich
Scanning Transmission Electron Microscopy
Language: en
Pages: 162
Authors: Alina Bruma
Categories: Technology & Engineering
Type: BOOK - Published: 2020-12-22 - Publisher: CRC Press

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Scanning Transmission Electron Microscopy: Advanced Characterization Methods for Materials Science Applications The information comprised in this book is focuse
Proceedings: Microscopy and Microanalysis 2002: Volume 8
Language: en
Pages: 556
Authors: Microscopy Society of America
Categories: Science
Type: BOOK - Published: 2002-12-16 - Publisher: Cambridge University Press

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This Proceedings volume contains extended abstracts of all the papers presented by microscopists in both the materials and life sciences at the Microscopy and M